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Agus, is this publication yours? Help us keep your profile up to date. Effects of annealing of MgO buffer layer on structural quality of ZnO layers grown by P-MBE on c-sapphire Agus Setiawan 2003, Materials Science in Semiconductor Processing We have investigated effects of annealing of MgO buffer layer on structural quality of ZnO layers grown by plasma assisted molecular beam epitaxy on c-sapphire. ZnO layers were characterized by atomic force microscopy, high resolution X-ray diffraction (HRXRD) and cross sectional transmission electron microscopy... Add to Profile This Is Not Me Adding this paper will upload it to Academia.edu. 580 California St., Suite 400, San Francisco, CA, 94104 Unsubscribe   Privacy Policy   Terms of Service   © 2022 Academia